1st Announcement and Call for Papers

Top

INTRODUCTION

AIMS

WHO SHOULD ATTEND

PROGRAM SCHEDULE

SUBMISSION of ABSTRACT

IMPORTANT DATES

CONFERENCE REGISTRATION FEE

VENUE

CONTACT PERSON

ORGANIZERS

CO-ORGANIZERS

Updated

27 January, 2006

INTRODUCTION

The X-Rays techniques have contributed a lot to research and services especially in quality control and characterization study. The advancement of knowledge in material science, solid-state physics, catalysis, medical and other fields have also benefited much from these techniques. With the recent inclusion of powerful software, plotting facilities to provide quick results and with high precision analysis, these techniques have gained much interest and have greatly widened its application in many new fields. Thus, it is timely to have this conference to take stock of the current development and deliberate on the recent innovation, and to introduce new ideas on development and future trends in applications of these techniques.

This conference is organized to provide an opportunity to all individuals and organizations who are involved and interested in the advancement of X-rays and related techniques to share their view and experience, in addition to being a forum for exchanging information, discussion of scientific problems and findings as well as fostering of friendship and partnership.

AIMS (top)

The conference offers:

Expert speakers on all pertinent aspects of X-Rays and related techniques
Platform for those involved/ interested in these techniques to share views and experiences
and to exchange information
Significant opportunities for discussions of scientific problems, findings and new frontiers
An exhibitions of state-of-art instrumentation by leading instrument manufacturers
Poster sessions for presentation of new development, applications and theories

WHO SHOULD ATTEND (top)

Manufacturers and users of X-Rays and related techniques including material scientists, engineers, medical surgeons, solid state physicists, chemist, geologist, dentist, interested parties and all those in area of manufacturing quality control of products and material characterizations.

PROGRAM SCHEDULE (top)

Pre-Conference Workshop

A Workshop on XRD & XRF Analysis will be held as a pre-conference workshop. This workshop targets users of XRD & XRF including material scientists, engineers, solid state physicists, researchers, chemists, geologists, technicians and all those interested are welcome to attend the workshop. Workshop fee is RM400 (USD120) per participant, which includes printing material, coffee/tea and lunch. The workshop will be held 2 days before the conference from November 27th to November 28th 2006.

Conference

The conference will be held for two days and will feature technical plenary, oral, and poster sessions covering the areas of

Material Characterization
Non-Destructive Testing (NDT) Technique
Medical/Life Sciences
Quantitative/Qualitative XRD, XPS, XRF, & EDX Analysis
Semiconductor and Thin Films
Modeling/Theoretical
Safety of X-Rays and Related Nuclear Techniques
Instrumentation and Computation
Synchrotron
Single Crystal Diffraction
and Other Related Techniques

Exhibition

An exhibition of equipment and software will form an integral part of the conference. We invite manufacturers, dealers and designer of instrument/ equipment to participate in the exhibition. For more details, please contact the ICXRI 2006 Conference Secretariat who will provide information about exhibition space. Please indicate your interest to participate in the exhibition in the registration form. The exhibition is open to all conference participants from 9.00 a.m. to 5.30 p.m. during the conference days, 29 – 30 November 2006

Oral & Poster

All registered participants are automatically qualified for poster competition to be organized in conjunction with the conference. Attractive prizes will be awarded to winners.

SUBMISSION of ABSTRACTS (top)

Interested authors are requested to complete the registration form and submit to the ICXRI 2006 Conference Secretariat. An abstract of 150-200 words should be submitted either by post or e-mail attachment files to the Secretariat not later than 31 May 2006. Please include the title of presentation, authors’ name, affiliation, addresses, telephone, fax and e-mail addresses for correspondence. All abstracts will be reviewed and if accepted, a 2 page extended abstract will be published in the proceeding. Those interested to have their papers published in the Journal of Nuclear and Related Technologies are requested to present a hard and soft copy of their full paper on the conference day for editorial evaluation.

IMPORTANT DATES (top)

31 May 2006                         : Deadline for abstract submission

30 Jun 2006                           : Notification of abstract acceptance

15 September 2006             : Extended abstract

CONFERENCE REGISTRATION FEES (top)

XAPP/MNS, MSNDT, EM Members	RM450 (USD130)
Non Member	RM550 (USD160)
Student	RM300 (USD86)
Exhibition (Space only)	RM1200 (USD343)
Pre-Conference Workshop	RM400 (USD120)
Workshop & Conference Package
Non-Student	RM750 (USD220)
Student	RM600 (USD172)